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dc.contributor.authorUnal, A.E.
dc.contributor.authorTasdemir K.
dc.contributor.authorBahcebasi A.
dc.date.accessioned2022-04-07T12:29:25Z
dc.date.available2022-04-07T12:29:25Z
dc.date.issued2021en_US
dc.identifier.isbn978-166543649-6
dc.identifier.urihttps://doi.org/10.1109/SIU53274.2021.9477791
dc.identifier.urihttps://hdl.handle.net/20.500.12573/1254
dc.description.abstractClassification of surface mounted devices plays an important role on automated inspection systems of printed component board production. Limited number of publicly available datasets which the components are labeled and high intraclass variance in these datasets causes the supervised approches to be inefficient. In this study a deep learning method, enhanced with an unsupervised clustering system, which uses a small set of labeled data is proposed. The method compared with the current studies and the supervised systems. Most optimized setting reached high accuracy results by outrunning current classification methods. © 2021 IEEE.en_US
dc.language.isoturen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.isversionof10.1109/SIU53274.2021.9477791en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAutomated vision inspection systemen_US
dc.subjectDeep learningen_US
dc.subjectPrinted circuit boarden_US
dc.subjectSemi-supervised image clusteringen_US
dc.subjectSurface-mount deviceen_US
dc.titlePCB component recognition with semi-supervised image clustering [Yari-gözetimli görüntü kümeleme ile baskili devre karti bileşeni tanima]en_US
dc.title.alternative[Yari-gözetimli görüntü kümeleme ile baskili devre karti bileşeni tanima]en_US
dc.typeconferenceObjecten_US
dc.contributor.departmentAGÜ, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.contributor.institutionauthorBahcebasi, A.
dc.contributor.institutionauthorTasdemir, K.
dc.contributor.institutionauthorBahcebasi, A.
dc.relation.journalSIU 2021 - 29th IEEE Conference on Signal Processing and Communications Applications, Proceedingsen_US
dc.relation.publicationcategoryKonferans Öğesi - Ulusal - Kurum Öğretim Elemanıen_US


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