dc.contributor.author | Liguori, R. | |
dc.contributor.author | Fusco, S. | |
dc.contributor.author | Usta, Hakan | |
dc.date.accessioned | 2021-08-24T06:38:22Z | |
dc.date.available | 2021-08-24T06:38:22Z | |
dc.date.issued | 2017 | en_US |
dc.identifier.isbn | 978-1-5090-3985-2 | |
dc.identifier.issn | 1545-827X | |
dc.identifier.uri | https://hdl.handle.net/20.500.12573/934 | |
dc.description.abstract | A novel semiconductor, the small molecule C6-NTTN, was used to fabricate organic thin film transistors (OTFTs). Different architectures and deposition techniques were employed, together with various surface treatments of the substrate, insulator and metal contacts, whose effect is analyzed through atomic force microscopy. The aim is to investigate the relationship between the process parameters and the electrical performance, with a particular attention to the quality of interfaces between active layers. The proportionality between the charge carrier mobility and the interface trap density was studied. | en_US |
dc.description.sponsorship | IEEE; IEEE Electron Devices Soc; Minist Res Innovat; IEEE Romania Sect, Electron Devices Chapter; IMT Bucharest, Natl Inst Res & Dev Microtechnologiers; S C SITEX 45 SRL; S C New Style Trans Prest S R L; S C Marido Cafe Club S R L; CARL ZEISS Instruments S R L | en_US |
dc.language.iso | eng | en_US |
dc.publisher | IEEE345 E 47TH ST, NEW YORK, NY 10017 USA | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | trap-limited charge transport | en_US |
dc.subject | semiconductor-metal interfaces | en_US |
dc.subject | semiconductor-insulator interfaces | en_US |
dc.subject | organic thin-film transistors (OTFTs) | en_US |
dc.title | Interface Engineering in Organic Thin Film Transistors | en_US |
dc.type | conferenceObject | en_US |
dc.contributor.department | AGÜ, Mühendislik Fakültesi, Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümü | en_US |
dc.contributor.institutionauthor | Usta, Hakan | |
dc.identifier.startpage | 143 | en_US |
dc.identifier.endpage | 146 | en_US |
dc.relation.journal | 2017 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS), 40TH EDITION | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Başka Kurum Yazarı | en_US |